Scanning probe microscopy and spectroscopy for mineral, biological and material sciences

Workshop by the Centro di Microscopia Elettronica del Dipartimento di Scienze Biologiche, Geologiche e Ambientali (Bigea, University of Bologna)

  • Date: 14 JULY 2017  from 9:50 to 17:40

  • Event location: Aula Magna di Anatomia Comparata, Via Selmi 3, (2° Piano) - Bologna

9.50-10.00 Welcome and opening address Prof. Alessandro Gargini (Head of Dept. BiGeA-UniBo); Giovanni Valdrè (CME-BO/BiGeA-UniBo) Contributions from University and CNR 10.00-10.20 A. Alessandrini (UniMoRe) - Atomic force microscopy investigation of the mechanical properties of neuroblastoma multiforme cells and their correlation with the migratory potential. 10.20-10.40 G. Zuccheri (UniBo) - Thin polymer layers on surfaces and block-copolymer self-assembly towards nanoelectronics and bioanalytics. 10.40-11.00 V. Palermo (ISOF-CNR) – Image processing of SPM data. A tool for metrology of graphene and other 2D materials. 11.00-11.20 G. Bussetti, R. Yivlialin, A. Li Bassi, C. S. Casari, M. Passoni, C. Castiglioni, M. Tommasini, L. Brambilla, L. Magagnin, A. Bossi, M. Penconi, M. Finazzi, F. Ciccacci and L. Duò (Politecnico di Milano) - Anion intercalation in graphite. Electrode evolution vs surface protection studied by a combined electrochemical scanning probe microscopy investigation. 11.20-11.40 C. Albonetti (ISMN-CNR, BO) - Organic islands growth on SiO2 surfaces as observed by SPM. Innovations in Scanning Probe Microscopy: 11.40-13.20 Contributions from the companies (Morning session) 11.40-12.00 Bruker - M. Febvre: SPM High resolution, Nanomechanics and nano-surface chemistry (Nano Raman, Nano IR). 12.00-12.20 Gambetti Kenologia (Park) - S. Alberici: Scanning Ion Conductance Microscopy (SICM) Technology and Its Application. 12.20-12.40 Oxford Instruments/Asylum Research - J. Lopez: Full-Featured Video-Rate AFM. 12.40-13.00 Pra.Ma. (NT-MTD) - D. Kazantsev, V. Polyakov, S. Lemeshko, E. Kazantseva: Material contrast mapping with nanometer resolution by Apertureless Scanning Near-Field Microscopy. 13.00-13.20 Biofotonica (JPK) – P. Antonucci: AFM for tissues and cells investigation in medical field: technology and results. 13.20-14.40 Lunch Break 14:40 - 16:20 Contributions from the companies (Afternoon session) 14.40-15.00 Assing - S. Chiesa: Complementary Techniques for Measuring Surface Mechanical Properties at the Micro and Nanoscale. 15.00-15.20 LOT-QuantumDesign/Nanosurf – S. Schutzmann: Beyond AFM: Advanced Nanotechnology Tools for Materials and Life Sciences. 15.20-15.40 Keysight Technologies/Agilent – S. Pergolini: New developments in AFM Technology and in the Electrical Characterization of Surfaces at the Nanoscale. 15.40-16.00 Elbatech – M. Sartore: From Internet-of-Things to Laboratory tool. 16.00-16.20 Schaefer South-East Europe/CSInstruments – P. Martinez: Advanced AFM electrical nanocharacterization of 2-D materials and semiconductors. 16.20-16.40 – Coffee Break Contributions from University 16.40-17.00 M. Marcaccio, S. Rapino (Ciamician-UniBo) – Probing Biological Systems and Nanostructured Materials by Scanning Electrochemical Microscopy. 17.00-17.20 T. Cramer, B. Fraboni (UniBo) - Atomic Force Microscopies to Study Electronic Properties and Strain in Thin Films for Flexible Electronics. 17.20-17.40 A. Simonelli, D. Moro, G. Ulian, G. Valdrè (BiGeA-UniBo) – Finite element analysis of probe-specimen interaction in SPM. 17.40 Concluding remarks


Prof. Giovanni Valdre

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Aula Magna di Anatomia Comparata, Via Selmi 3, (2° Piano) - Bologna