Functional Safety: Risk Assessment, Systematic and Random Cause of Failures, Safety Mechanisms

The seminar is held by Dott. Mauro Pipponzi, Chief Technical Officer at ELES Semiconductor Equipment, in the framework of the Master's Degree course "Industrial Trends In Electronics M"

  • Date: 06 MAY 2022  from 16:00 to 18:00

  • Event location: AULA MAGNA FOSCOLO - Via Ugo Foscolo, 7 - Bologna - In presence and online event

  • Type: Seminar

Abstract

An introduction to the main topics of functional safety, with particular regard to solution addressing semiconductors. An overview of the standards related to the different market sectors will be given focusing then on the automotive standard ISO26262. Risk assessment, systematic and random failures as well as mitigation techniques will be addressed.

 

BIO

Mauro Pipponzi has worked for more than 35 years in IC design and EDA. His experience covers designing and managing products in a number of application areas such as Consumer, Telecom and Automotive, as well as working on software solutions for testing, synthesis, and functional safety. After spending the 2010s working on Functional Safety methodology and automation, including several years at Intel, in 2020 he joined ELES, an Italian company providing solutions for test and reliability".

Contacts

prof.ssa Cecilia Metra

Full Professor

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